PEI Zhen-jiang1, YAO Si-li2, HE Jun-jia1, et al. Comparison of Several Synthetic Test Circuits for Ultra-high Voltage Circuit Breakers[J]. High voltageapparatus, 2006, (5): 321-323.
PEI Zhen-jiang1, YAO Si-li2, HE Jun-jia1, et al. Comparison of Several Synthetic Test Circuits for Ultra-high Voltage Circuit Breakers[J]. High voltageapparatus, 2006, (5): 321-323.DOI:
It is a key problem to research the high power interrupting performance test method of ultra-high-voltage circuit breakers for UHV transmission technology development. Several synthetic test circuits for UHV circuit breakers are simulated in this paper. Firstly
the interrupting arc burning physics is analyzed. Based on the Mayr arc equation
the arc resistance model used in PSCAD simulation is fabricated. Employed this arc resistance model
the circuit breaker interrupting performance of the direct test circuit
the Hitashi four-parameter synthetic test circuit and the EPIC circuit proposed by ABB are simulated. The arc process and transient recovery voltage are compared.