MU Lei, LIU Jia-qi, WANG Xiao-ming, et al. Measurement of Transient Voltage Distribution in the Outer Semiconducting Layer of XLPE Cable Windings[J]. High voltageapparatus, 2005, (3): 217-219.
MU Lei, LIU Jia-qi, WANG Xiao-ming, et al. Measurement of Transient Voltage Distribution in the Outer Semiconducting Layer of XLPE Cable Windings[J]. High voltageapparatus, 2005, (3): 217-219.DOI:
XLPE电缆绕组外半导电层的暂态电压分布测量
摘要
通过对无金属外屏蔽及护套的XLPE电缆绕组芯线加冲击电压测取外半导电层上电压分布的方法
得出了在冲击电压作用下
无论绕组开路或短路
绕组前部的外半导电层是最薄弱部位的结论。为新型电力设备的设计、保护及试验技术提供了依据。
Abstract
Based on the experimental researches
it can be concluded that under impulse voltage stresses
either the winding is in open or in short circuit condition
the insulation at the beginning of winding is the weakest. It provides a theoretical basis for the design
protection and experimentation of new type electric equipment.