GE Wei-min. Typical Circuit and Calculation for Induced Withstanding Voltage Test and Partial Discharge Test[J]. High voltageapparatus, 2004, (5): 324-326.
GE Wei-min. Typical Circuit and Calculation for Induced Withstanding Voltage Test and Partial Discharge Test[J]. High voltageapparatus, 2004, (5): 324-326.DOI: