基于Stark展宽法对真型断路器中电弧电子密度诊断的研究

肖剑桥; 孙昊; 李刚; 左耘溦; 卢阳; 刘平; 宇文博

doi:10.13296/j.1001-1609.hva.2026.10.003

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基于Stark展宽法对真型断路器中电弧电子密度诊断的研究

研究与分析 | 更新时间：2026-10-14

- 基于Stark展宽法对真型断路器中电弧电子密度诊断的研究
- Research on Electron Density Diagnosis of Arcs in Full-scale Circuit Breakers Based on the Stark Broadening Method
- 高压电器 2026年62卷第10期页码：25-31
- 作者机构：
  
  西安交通大学电气学院，西安 710049
  西安高压电器研究院股份有限公司，西安 710077
- 作者简介：
  
  肖剑桥（2000—），女，硕士研究生，研究方向为开关电弧光学诊断方法。
  孙昊（1988—），男，教授，研究方向为电力开关装备开断技术（通信作者）（E-mail:sunhao1031@xjtu.edu.cn）
- 基金信息：
  
  国家重点研发计划;National Key Research and Development Program(2021YFB2400604);国家自然科学基金项目(52077170)
- DOI：10.13296/j.1001-1609.hva.2026.10.003
  中图分类号：
- 收稿：2026-04-16，
  
  修回：2026-07-24，
  
  纸质出版：2026-10-16
- 稿件说明：
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肖剑桥, 孙昊, 李刚, 等. 基于Stark展宽法对真型断路器中电弧电子密度诊断的研究[J]. 高压电器, 2026,62(10):25-31.

XIAO Jianqiao, SUN Hao, LI Gang, et al. Research on Electron Density Diagnosis of Arcs in Full-scale Circuit Breakers Based on the Stark Broadening Method[J]. High Voltage Apparatus, 2026, 62(10): 25-31.
肖剑桥, 孙昊, 李刚, 等. 基于Stark展宽法对真型断路器中电弧电子密度诊断的研究[J]. 高压电器, 2026,62(10):25-31. DOI： 10.13296/j.1001-1609.hva.2026.10.003.

XIAO Jianqiao, SUN Hao, LI Gang, et al. Research on Electron Density Diagnosis of Arcs in Full-scale Circuit Breakers Based on the Stark Broadening Method[J]. High Voltage Apparatus, 2026, 62(10): 25-31. DOI： 10.13296/j.1001-1609.hva.2026.10.003.

摘要

高压电器设备中，内部产生的电弧直接关系着开关电器开断的成功与否，因此对电弧等离子体的诊断必不可少。发射光谱法通过测量原子特征谱线的发射强度，可有效诊断等离子体电子密度。该技术具有非入侵测量、瞬态探测、检出限低、选择性好、仪器简单等优点。在研究中，关注的对象为2 bar下768 A电流峰值时刻的交流空气电弧。弧光信号通过透镜、光栅元件等光学器件进行分光，并采用ICCD采集电弧的发射光谱。由于仅能获取弧光在观察窗的二维投影，需借助Abel逆变换重建实际的光谱分布，获得发射强度沿弧柱的径向分布。研究中合理选取了NⅡ571.8 nm谱线作为特征谱线，将实测的Voigt线型去卷积，应用Stark展宽法，获得电弧电子密度在0.02～1.724×10

-3

的范围内变化的数据结果。研究首次在含喷口和气吹条件下的真型断路器中，通过Stark展宽法诊断了电弧电子密度。该结果对深入理解电弧内部微观机理和特性具有重要意义，为高压电器设备的仿真和参数计算工作提供了数据参考。

Abstract

In high-voltage electrical equipment

the arc generated internally is directly related to the success or failure of the interruption of switchgear

making the diagnosis of the arc plasma essential. Emission spectroscopy

by measuring the emission intensity of characteristic atomic spectral lines

can effectively diagnose the electron density of plasma. This technique offers such advantages as non-invasive measurement

transient detection

low detection limits

good selectivity

and simple instrumentation. In this study

the subject of investigation is an AC air arc at a peak current of 768 A under a pressure of 2 bar. The arc light signal is spectrally dispersed through optical components such as lenses and gratings

and the emission spectrum of the arc is captured using an ICCD. Since only the two-dimensional projection of the arc light through an observation window can be obtained

it is necessary to employ the Abel inversion to reconstruct the actual spectral distribution

and obtain the radial distribution of emission intensity distribution along the arc column. In the study

the N II 571.8 nm spectral line is reasonably selected as the characteristic line. The measured Voigt profile is deconvoluted

and the Stark broadening method is applied to obtain the data result on the spatial variation of the arc electron density within the range of 0.02 to 1.724×10

-3

. For the first time

this study diagnoses the arc electron density in a full-scale circuit breaker with nozzle and gas-blowing conditions using the Stark broadening method. These results are of great significance for an in-depth understanding of the internal microscopic mechanisms and characteristics of the arc

and provide data references for the simulation and parameter calculation of high-voltage electrical equipment.

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