CHEN Yong, HE Cheng-ji. Analysis of Operational Failure and Reliability for Type C954 High Voltage Te rylene Capacitor[J]. High voltageapparatus, 2004, (1): 61-62.
CHEN Yong, HE Cheng-ji. Analysis of Operational Failure and Reliability for Type C954 High Voltage Te rylene Capacitor[J]. High voltageapparatus, 2004, (1): 61-62.DOI:
This paper primarily discuss es the failure mechanism and the failure mode of the type C954capacitor as well as the measures to improve the operational reliability of the capacitor.