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沈阳高压开关有限责任公司,辽宁,沈阳,100025
纸质出版日期:2001
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[1]沈聿修.关于短时耐受电流密度值[J].高压电器,2001(01):52-53.
SHEN Yuxiu. DISCUSSION ON THE SHORT-TIME WITHSTAND CURRENT DENSITY[J]. High voltageapparatus, 2001, (1): 52-53.
[1]沈聿修.关于短时耐受电流密度值[J].高压电器,2001(01):52-53. DOI:
SHEN Yuxiu. DISCUSSION ON THE SHORT-TIME WITHSTAND CURRENT DENSITY[J]. High voltageapparatus, 2001, (1): 52-53. DOI:
为方便导电回路设计取值
计算了常用导电材料的短时耐受电流密度值
并与通常估算的电流密度值作了比较。
For the purpose of convenient choice of conductive circuit design
the short-time withstand current densities of conductive materials in common use are calculated
which are compared with the previous estimated values in this paper.
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