Research on Multi Type Defect Detection of Transmission Line Insulators Based on GE-YOLO Algorithm
|更新时间:2025-06-11
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Research on Multi Type Defect Detection of Transmission Line Insulators Based on GE-YOLO Algorithm
Moren Journal(2025)
作者机构:
1.智慧能源技术湖北省工程研究中心,湖北省宜昌市443002
2.三峡大学电气与新能源学院,湖北省宜昌市443002
作者简介:
基金信息:
National Natural Science Foundation of China(52077120)
DOI:
CLC:
Received:03 September 2024,
Revised:22 October 2024,
Accepted:22 October 2024,
稿件说明:
移动端阅览
WANG Qiang, FENG Yuntao, ZHOU Chao. Research on Multi Type Defect Detection of Transmission Line Insulators Based on GE-YOLO Algorithm[J/OL]. Moren journal, 2025.
DOI:
WANG Qiang, FENG Yuntao, ZHOU Chao. Research on Multi Type Defect Detection of Transmission Line Insulators Based on GE-YOLO Algorithm[J/OL]. Moren journal, 2025.DOI:
Research on Multi Type Defect Detection of Transmission Line Insulators Based on GE-YOLO Algorithm
Due to objective limitations such as small target size and complex background in aerial images of line insulators
traditional detection algorithms and most lightweight networks are difficult to accurately identify target defects. This article proposes a multi type defect detection model for insulators based on GE-YOLO. The algorithm is based on YOLOv8s and combines grouping convolution and multi-scale fusion ideas to design Grouping Multi Scale Convolution (GMSC)
which is used to improve C2f and enhance the model's feature extraction ability; Introducing an efficient multi-scale attention mechanism (EMA) into the feature fusion network to improve the model's target localization ability; Finally
replace the loss function with Wise IOU to reduce the excessive penalty of geometric factors and improve the performance of model regression. The experimental results show that the computational complexity of the optimized network model remains basically unchanged
meeting the edge computing power requirements. The overall mAP is increased by 5.5%
among which the mAP of damaged insulators is increased by 10.9%. This algorithm can achieve more balanced and low detection of multiple types of defects in insulators.
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