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Simulation and Analysis on Error of Protective Type CT due to Residual Magnetism
更新时间:2025-04-26
    • Simulation and Analysis on Error of Protective Type CT due to Residual Magnetism

    • High VoltageApparatus   Issue 1, Pages: 26-28(2005)
    • CLC: TM452
    • Published:2005

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  • QIAN Jia-li1, GUAN Yong-gan1, XU Guo-zheng1, et al. Simulation and Analysis on Error of Protective Type CT due to Residual Magnetism[J]. High voltageapparatus, 2005, (1): 26-28. DOI:

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Related Author

陈晓宁
马志瀛
金立军
吴军辉
沈钰
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Related Institution

  西安交通大学  
  西安交通大学 710049  
  江苏理工大学  
  江苏理工大学 镇江212013  
Dept. of Elec. and Information Eng., Hu’nan Institute of Engineering
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