Analysis of Operational Failure and Reliability for Type C954 High Voltage Te rylene Capacitor

CHEN Yong; HE Cheng-ji

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Analysis of Operational Failure and Reliability for Type C954 High Voltage Te rylene Capacitor

更新时间：2025-04-26

- Analysis of Operational Failure and Reliability for Type C954 High Voltage Te rylene Capacitor
- High VoltageApparatus Issue 1, Pages: 61-62(2004)
- 作者机构：
  
  1. 中国工程物理研究院电子工程研究所
  2. 中国工程物理研究院电子工程研究所四川绵阳621900
- 作者简介：
- 基金信息：
- DOI：
  CLC： TM533
- Published：2004
- 稿件说明：
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[1]陈勇,何承基.C954型高压涤纶电容器失效与可靠性分析[J].高压电器,2004(01):61-62.

CHEN Yong, HE Cheng-ji. Analysis of Operational Failure and Reliability for Type C954 High Voltage Te rylene Capacitor[J]. High voltageapparatus, 2004, (1): 61-62.
[1]陈勇,何承基.C954型高压涤纶电容器失效与可靠性分析[J].高压电器,2004(01):61-62. DOI：

CHEN Yong, HE Cheng-ji. Analysis of Operational Failure and Reliability for Type C954 High Voltage Te rylene Capacitor[J]. High voltageapparatus, 2004, (1): 61-62. DOI：

摘要

重点介绍了C954型高压涤纶电容器的失效机理、失效模式以及提高该电容器可靠性的技术措施。

Abstract

This paper primarily discuss es the failure mechanism and the failure mode of the type C954capacitor as well as the measures to improve the operational reliability of the capacitor.

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