CALIBRATION OF CAPACITIVE PROBE MEASUREMENT FOR INSULATOR SURFACE CHARGE

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CALIBRATION OF CAPACITIVE PROBE MEASUREMENT FOR INSULATOR SURFACE CHARGE

更新时间：2025-04-26

- CALIBRATION OF CAPACITIVE PROBE MEASUREMENT FOR INSULATOR SURFACE CHARGE
- High VoltageApparatus Issue 2, Pages: 40-43(2002)
- 作者机构：
  
  1. 西安交通大学电气工程学院
  2. 西安交通大学电气工程学院陕西西安710049
- 作者简介：
- 基金信息：
- DOI：
  CLC： TM934
- Published：2002
- 稿件说明：
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[1]汪沨,胡红利,张乔根,陈庆国,邱毓昌.用于绝缘子表面电荷测量的电容探头法的标度问题[J].高压电器,2002(02):40-43.

CALIBRATION OF CAPACITIVE PROBE MEASUREMENT FOR INSULATOR SURFACE CHARGE[J]. High voltageapparatus, 2002, (2): 40-43.
[1]汪沨,胡红利,张乔根,陈庆国,邱毓昌.用于绝缘子表面电荷测量的电容探头法的标度问题[J].高压电器,2002(02):40-43. DOI：

CALIBRATION OF CAPACITIVE PROBE MEASUREMENT FOR INSULATOR SURFACE CHARGE[J]. High voltageapparatus, 2002, (2): 40-43. DOI：

摘要

80年代初

电容探头测量绝缘子表面电荷技术开始应用于高压领域

但由于问题的复杂性

该方法无论是在原理上还是在技术上都还有待于进一步完善。笔者综述了这一技术的原理、最新研究成果和将来可能的研究课题

Abstract

In early 1980’s

the capacitive probe measurement technique was employed in the field of high voltage engineering for surface charge measurement on insulator surface. Owing to the complexity of the problem

the principle of charge measurement in this case is neither fully understood nor well established. This paper reviews the basic principle of surface charge measurement

and the recent results acquired by some investigators and the further research topics.

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