CHEN Jin-xiang 1, LIN Yi-hong 1, XU Shen-hao 2. COMMENTS ON SERIES RESONANT DEVICE WITH VARIABLE FREQUENCY FOR GIS FIELD TEST[J]. High voltageapparatus, 2003, (4): 76-78.
CHEN Jin-xiang 1, LIN Yi-hong 1, XU Shen-hao 2. COMMENTS ON SERIES RESONANT DEVICE WITH VARIABLE FREQUENCY FOR GIS FIELD TEST[J]. High voltageapparatus, 2003, (4): 76-78.DOI:
COMMENTS ON SERIES RESONANT DEVICE WITH VARIABLE FREQUENCY FOR GIS FIELD TEST
摘要
重点分析了调频式串联谐振耐压装置现场试验时可能出现品质因数Q值上不去的原因及相应的防止措施
对该装置耐压试验击穿电流进行了详细的分析
指出其对被试品不会造成进一步的损伤。
Abstract
The reason that quality factor Q is not get high during field test is analysed
and some preventive steps are suggested in this paper.Then
through analysing the value of breakdown current of series resonant device with variable frequency
it is considered that the breakdown current wouldn’t hurt the object under test further.