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SURGE IMMUNITY TESTS FOR ELECTRONIC DEVICES
更新时间:2025-04-26
    • SURGE IMMUNITY TESTS FOR ELECTRONIC DEVICES

    • High VoltageApparatus   Issue 4, Pages: 18-19(2001)
    • CLC: TM866
    • Published:2001

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  • FANG Zhi, QIU Yu chang. SURGE IMMUNITY TESTS FOR ELECTRONIC DEVICES[J]. High voltageapparatus, 2001, (4): 18-19. DOI:

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Related Author

WANG Cong
LIU Yichen
PENG Long
LI Pengfei
WANG Chenxing
SHI Wei
LIU Qing
DU Bin

Related Institution

North China Branch of State Grid Corporation of China
Electric Power Research Institute, Jibei Electric Power Co., Ltd.
North China Electric Power Research Institute Co., Ltd.
  西安交通大学电气工程学院 陕西西安710049  
School of Electrical Engineering,Xi’an Jiaotong University
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