Analog Tests on Vacuum Interrupter Restrike

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Analog Tests on Vacuum Interrupter Restrike

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- Analog Tests on Vacuum Interrupter Restrike
- High VoltageApparatus Issue 5, Pages: 9-14(1996)
- 作者机构：
  
  1. 西安交通大学
  2. 西安交通大学 710049
- 作者简介：
- 基金信息：
- DOI：
  CLC： TM564
- Published：1996
- 稿件说明：
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[1]江文泉,李宏群,付军.真空开关重击穿现象的模拟试验研究[J].高压电器,1996(05):9-14.

Analog Tests on Vacuum Interrupter Restrike[J]. High voltageapparatus, 1996, (5): 9-14.
[1]江文泉,李宏群,付军.真空开关重击穿现象的模拟试验研究[J].高压电器,1996(05):9-14. DOI：

Analog Tests on Vacuum Interrupter Restrike[J]. High voltageapparatus, 1996, (5): 9-14. DOI：

摘要

在试验室对真空开关开断容性负载时重击穿现象进行了模拟试验研究

用特殊的合成试验回路对比测量了三种常用触头材料的性能

分析了电流老炼使重击穿概率下降的规律。

Abstract

Analog tests on capacitance switching with vacuum interrupters are carried on in lab. A special synthetic circuit is used in tests to compare the re-striking properties of different contact material. The restrike probability after arcing

which is under the effect of current conditioning

is studied.

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