Study of Defects on The Surface of CuCr Contact

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Study of Defects on The Surface of CuCr Contact

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- Study of Defects on The Surface of CuCr Contact
- High VoltageApparatus Issue 4, Pages: 3-6(1997)
- 作者机构：
  
  1. 成都有旭光电子股份有限公司
  2. 成都有旭光电子股份有限公司 610500
- 作者简介：
- 基金信息：
- DOI：
  CLC： TM503.5
- Published：1997
- 稿件说明：
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[1]王成林,崔伟,陈军平,倪世龙.CuCr触头表面黑斑与黄斑缺陷的研究[J].高压电器,1997(04):3-6.

Study of Defects on The Surface of CuCr Contact[J]. High voltageapparatus, 1997, (4): 3-6.
[1]王成林,崔伟,陈军平,倪世龙.CuCr触头表面黑斑与黄斑缺陷的研究[J].高压电器,1997(04):3-6. DOI：

Study of Defects on The Surface of CuCr Contact[J]. High voltageapparatus, 1997, (4): 3-6. DOI：

摘要

研究了在CuCr触头表面发现的一种缺陷——黑斑与黄斑的形成原因及其对灭弧室性能及制造过程的影响

并提出了消除黑斑及黄斑的措施。

Abstract

Some kind of defects-black spots and yellow spots on the surface of CuCr contact

which are considered having an effect on performance of vacuum interrupter

are found. Spots producing mechanism is discussed and some methods for eliminating the spots are suggested.

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