Synthetic Test Conditions and Circuits for Asymmetrical Current Breaking

Wu Shenggang

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Synthetic Test Conditions and Circuits for Asymmetrical Current Breaking

更新时间：2025-04-26

- Synthetic Test Conditions and Circuits for Asymmetrical Current Breaking
- High VoltageApparatus Issue 6, Pages: 22-28(1995)
- 作者机构：
  
  西安高压电器研究所,710077
- 作者简介：
- 基金信息：
- DOI：
  CLC： TM564
- Published：1995
- 稿件说明：
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[1]吴盛刚.非对称电流开断合成试验的试验条件及试验线路[J].高压电器,1995(06):22-28.

Wu Shenggang. Synthetic Test Conditions and Circuits for Asymmetrical Current Breaking[J]. High voltageapparatus, 1995, (6): 22-28.
[1]吴盛刚.非对称电流开断合成试验的试验条件及试验线路[J].高压电器,1995(06):22-28. DOI：

Wu Shenggang. Synthetic Test Conditions and Circuits for Asymmetrical Current Breaking[J]. High voltageapparatus, 1995, (6): 22-28. DOI：

摘要

阐述了进行非对称电流开断合成试验的必要性和特殊性。对其试验条件作了分析计算

简要介绍了目前国内外常用的试验方法及其局限性

从而提出了两种构思新颖的原理线路

并对它们进行了比较。

Abstract

Necessity and speciality for synthetic test for asymmetrical current breaking are explained. The test conditions are analysed

and the test circuits fre-quently used at present in China and abroad and their limitations are introduced briefly. Finally

two of new principlal circuits are put forward and compared with each other.

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