A New Design.of Synthetic Test Circuit with Minimum Current Distortion

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A New Design.of Synthetic Test Circuit with Minimum Current Distortion

更新时间：2025-04-26

- A New Design.of Synthetic Test Circuit with Minimum Current Distortion
- High VoltageApparatus Issue 4, Pages: 16-21+31(1995)
- 作者机构：
  
  1.   西安交通大学
  2.   秦川电工材料及设备研究所 710049
  3.   西安 710043
- 作者简介：
- 基金信息：
- DOI：
  CLC： TM561
- Published：1995
- 稿件说明：
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[1]江文泉,李宏群,贾申利,王季梅,吴学栋.一种电流畸变小的合成回路[J].高压电器,1995(04):16-21+31.

A New Design.of Synthetic Test Circuit with Minimum Current Distortion[J]. High voltageapparatus, 1995, (4): 16-21+31.
[1]江文泉,李宏群,贾申利,王季梅,吴学栋.一种电流畸变小的合成回路[J].高压电器,1995(04):16-21+31. DOI：

A New Design.of Synthetic Test Circuit with Minimum Current Distortion[J]. High voltageapparatus, 1995, (4): 16-21+31. DOI：

摘要

提出了一种新的能减小电流畸变的振荡型合成回路

并从理论计算和实验验证两方面对新的回路进行了分析。研究结果表明这种合成回路能够为被试开关提供更接近于实际情况的开断条件。

Abstract

A new design of synthetic test circuit which can reduce current dis-tortion around current zero is proposed in this paper. The characteristics of the new synthetic circuit is studied through both theoretical calculation and practical experi-ments. The results show that the newly proposed synthetic circuit can generate more realistic interruption conditions than previous one.

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