Probability of Breakdown in SF<sub>6</sub> Gas and Its Discharging Random Model

doi:10.13296/j.1001-1609.hva.2000.06.004

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Probability of Breakdown in SF₆ Gas and Its Discharging Random Model

更新时间：2025-04-26

- Probability of Breakdown in SF₆ Gas and Its Discharging Random Model
- High VoltageApparatus Issue 6, Pages: 15-19(2000)
- 作者机构：
  
  1. 西安交通大学!西安710049
  2. 哈尔滨工业大学!哈尔滨150001
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2000.06.004
  CLC： TM85
- Published：2000
- 稿件说明：
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[1]陈庆国,张乔根,汪沨,邱毓昌,魏新劳.SF_6气体中的击穿概率与放电随机模型[J].高压电器,2000(06):15-19.

Probability of Breakdown in SF₆ Gas and Its Discharging Random Model[J]. High voltageapparatus, 2000, (6): 15-19.
[1]陈庆国,张乔根,汪沨,邱毓昌,魏新劳.SF_6气体中的击穿概率与放电随机模型[J].高压电器,2000(06):15-19. DOI： 10.13296/j.1001-1609.hva.2000.06.004.

Probability of Breakdown in SF₆ Gas and Its Discharging Random Model[J]. High voltageapparatus, 2000, (6): 15-19. DOI： 10.13296/j.1001-1609.hva.2000.06.004.

摘要

探讨了ＳＦ６气体中电子的产生和击穿概率，并给出了放电通道发展的随机模型。模拟结果与实际拍得的放电图形相比可得，建立于放电通道前方电场强度及临界场强的随机概率模型可对放电发展过程进行较有效的模拟。

Abstract

The electronic production and the breakdown probability in SF6 gas are discussed and the whom model of discharging is presented in this paper. Compared with the experimental discharging photos

the simulated results based on the random model prove that the model is an effective simulation of discharging process.

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Probability of Breakdown in SF6 Gas and Its Discharging Random Model

DOI：10.13296/j.1001-1609.hva.2000.06.004

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Abstract

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Probability of Breakdown in SF₆ Gas and Its Discharging Random Model