Research on EFT/B Countermeasure of Microprocessor Protection Device

WANG Yu-feng1; ZOU Ji-yan2; LIAO Min-fu2

doi:10.13296/j.1001-1609.hva.2010.10.003

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Research on EFT/B Countermeasure of Microprocessor Protection Device

更新时间：2025-04-26

- Research on EFT/B Countermeasure of Microprocessor Protection Device
- High VoltageApparatus Vol. 46, Issue 10, Pages: 10-15(2010)
- 作者机构：
  
  1. 辽宁科技大学
  2. 大连理工大学
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2010.10.003
  CLC： TM774
- Published：2010
- 稿件说明：
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[1]王玉峰,邹积岩,廖敏夫.微机保护装置抗电快速瞬变脉冲群的研究[J].高压电器,2010,46(10):10-15.

WANG Yu-feng1, ZOU Ji-yan2, LIAO Min-fu2. Research on EFT/B Countermeasure of Microprocessor Protection Device[J]. High voltageapparatus, 2010, 46(10): 10-15.
[1]王玉峰,邹积岩,廖敏夫.微机保护装置抗电快速瞬变脉冲群的研究[J].高压电器,2010,46(10):10-15. DOI： 10.13296/j.1001-1609.hva.2010.10.003.

WANG Yu-feng1, ZOU Ji-yan2, LIAO Min-fu2. Research on EFT/B Countermeasure of Microprocessor Protection Device[J]. High voltageapparatus, 2010, 46(10): 10-15. DOI： 10.13296/j.1001-1609.hva.2010.10.003.

摘要

为了抑制电快速瞬变脉冲群（简称EFT/B）对微机保护装置的干扰

首先分析EFT/B干扰微机保护装置使其发生显示不正常、误动、拒动、甚至系统死机的原因。然后

通过对微机保护装置的外部端口施加EFT/B的试验方法来测试各种保护措施抑制EFT/B的效果。最后

对一套真空度在线监测系统进行EFT/B抗扰度试验测试

试验结果表明

改进的分布式电源、铁氧体磁珠、去耦电容等保护措施对EFT/B具有较好的抑制作用。

Abstract

In order to protect microprocessor protection devices from EFT/B

the cause about abnormal of display

malfunction

rejecting act and even a crash of microprocessor protection devices when it suffer from EFT/B was analyzed firstly.Then

effect of each EFT/B countermeasure was tested when external port of microprocessor protection devices was suffering from EFT/B.Finally

a set of vacuum monitoring system on-line was under EFT/B immunity test.The experiment indicated that EFT/B countermeasures such as improved distribution power supply

ferrite bead and decoupling capacitor were effective.

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