您当前的位置:
首页 >
文章列表页 >
Analysis of the Thyristor Trip Caused by Overhigh Junction Temperature
更新时间:2025-04-26
    • Analysis of the Thyristor Trip Caused by Overhigh Junction Temperature

    • High VoltageApparatus   Vol. 46, Issue 10, Pages: 102-104+108(2010)
    • DOI:10.13296/j.1001-1609.hva.2010.10.025    

      CLC: TN344
    • Published:2010

    移动端阅览

  • WANG Hui-yan. Analysis of the Thyristor Trip Caused by Overhigh Junction Temperature[J]. High voltageapparatus, 2010, 46(10): 102-104+108. DOI: 10.13296/j.1001-1609.hva.2010.10.025.

  •  
  •  

0

Views

141

下载量

4

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

Analysis and Treatment of Partial Discharge Excess in 4 500 A Thyristor Valve
Study on AC Voltage Test Method of UHVDC Valve
Analysis on the Thyristor Valve Structure of ±500 kV Converter Station
Analysis on Number Limitation of BOD Triggered Thyristors in a Thyristor Valve
Simulation Study on Switching Overvoltage in Converter Substation Caused by Grounding Fault at the Top of High-voltage Thyristor Valve

Related Author

FENG Song-kui
LI Xia
WANG Hui-yan
ZHANG Xiao-yong
JIA Tao
DANG Yuan
YANG Tao
CHEN Nan

Related Institution

Xi’an High Voltage Appararus Research Institute Co.,Ltd.
School of Electrical Engineering,Guizhou University
EHV Power Transmission Company of China Southern Power Grid
Xi’an XD Power System Co.,Ltd.
Pinggao Group Co., Ltd.
0