WANG Hui-yan. Analysis of the Thyristor Trip Caused by Overhigh Junction Temperature[J]. High voltageapparatus, 2010, 46(10): 102-104+108. DOI: 10.13296/j.1001-1609.hva.2010.10.025.
Analysis of the Thyristor Trip Caused by Overhigh Junction Temperature
the corresponding rated DC current is the largest in the world at present
the thyristor trip caused by overhigh junction temperature occurred frequently
during system commissioning test.These events have been investigated in this paper
and the real trip reason is not from thyristor valve cooling system
but from the design unreasonable of thyristor junction temperature protection criterion in AREVA′s valve based electronic equipment(VBE).The improvement suggestion is cancel the repeated temperature protection from VBE
or adjust the temperature protection criterion and only makes the backstage record to its application.