YAN Bin, HE Xi-mei, WANG Zhi-hui, et al. Application of X-ray Digital Imaging Defect Detection System in GIS Equipment[J]. High voltageapparatus, 2010, 46(11): 89-91.
YAN Bin, HE Xi-mei, WANG Zhi-hui, et al. Application of X-ray Digital Imaging Defect Detection System in GIS Equipment[J]. High voltageapparatus, 2010, 46(11): 89-91. DOI: 10.13296/j.1001-1609.hva.2010.11.002.
Application of X-ray Digital Imaging Defect Detection System in GIS Equipment
摘要
采用X射线透照技术
对GIS设备内部结构在成像板上进行成像
并使用数字扫描系统读取成像板上的图像信息
显示出设备内部结构影像
通过对现场不同电压等级GIS设备的成像试验
得到清晰的内部结构影像
实现了"可视化"检测的目的
为设备的故障诊断及状态检修提供了技术支持。
Abstract
The X-ray digital imaging defect detection system is used based on X-ray trans-illumination technology to image the internal structure of GIS equipment on the imaging plate.The image information on the imaging plate was then read by a digital scanning system and the internal structure of the GIS was then revealed for analysis.Based on imaging tests on GIS equipment with different voltage levels
this system can acquire clear image of the internal structure of GIS and makes the "visual" detection of faults possible
providing technical support to the fault fast diagnosis and condition-based maintenance of device.