LI Juan1, WU Xue-feng1, HONG Guo-yao1, et al. Bonding Strength Comparison of the Epoxy Bonded Hollow Porcelain Insulators Suffered Different Artificial Environments[J]. High voltageapparatus, 2011, 47(1): 75-79.
LI Juan1, WU Xue-feng1, HONG Guo-yao1, et al. Bonding Strength Comparison of the Epoxy Bonded Hollow Porcelain Insulators Suffered Different Artificial Environments[J]. High voltageapparatus, 2011, 47(1): 75-79. DOI: 10.13296/j.1001-1609.hva.2011.01.017.
Bonding Strength Comparison of the Epoxy Bonded Hollow Porcelain Insulators Suffered Different Artificial Environments
The epoxy bonded hollow insulator samples suffered different artificial environments were tested to compare their bonding strength in terms of bending strength.The samples were made of the same material as the 550 kV hollow insulator.The test data were processed with variance analysis.The results show that the artificial environments of high/low temperature
water immersion
ultraviolet radiation
ozone and 1% hydrofluoric acid solution impose no significant effect on the surface of the samples
however
5% hydrofluoric acid solution imposes significant effect on the bonding strength of the samples.