Review of Grading Capacitors of Multi-break Vacuum Circuit Breakers

WU Gao-bo; RUAN Jiang-jun; HUANG Dao-chun; SHU Sheng-wen; ZHANG Kun

doi:10.13296/j.1001-1609.hva.2011.03.015

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Review of Grading Capacitors of Multi-break Vacuum Circuit Breakers

更新时间：2025-04-26

- Review of Grading Capacitors of Multi-break Vacuum Circuit Breakers
- High VoltageApparatus Vol. 47, Issue 3, Pages: 77-81(2011)
- 作者机构：
  
  武汉大学电气工程学院
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2011.03.015
  CLC： TM561.2
- Published：2011
- 稿件说明：
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[1]吴高波,阮江军,黄道春,舒胜文,张坤.多断口真空断路器均压电容研究综述[J].高压电器,2011,47(03):77-81.

WU Gao-bo, RUAN Jiang-jun, HUANG Dao-chun, et al. Review of Grading Capacitors of Multi-break Vacuum Circuit Breakers[J]. High voltageapparatus, 2011, 47(3): 77-81.
[1]吴高波,阮江军,黄道春,舒胜文,张坤.多断口真空断路器均压电容研究综述[J].高压电器,2011,47(03):77-81. DOI： 10.13296/j.1001-1609.hva.2011.03.015.

WU Gao-bo, RUAN Jiang-jun, HUANG Dao-chun, et al. Review of Grading Capacitors of Multi-break Vacuum Circuit Breakers[J]. High voltageapparatus, 2011, 47(3): 77-81. DOI： 10.13296/j.1001-1609.hva.2011.03.015.

摘要

由于杂散电容的影响

多断口真空断路器的电压分布是不均匀的

但是目前尚无针对多断口真空断路器的均压电容选择方法。笔者对多断口真空断路器均压电容的研究现状进行了综述

总结了均压电容对提高多断口真空断路器开断能力的积极作用和可能带来的负面效应

并对积极作用以及负面效应的产生机理进行了分析。指出了现有研究的局限性

并进行了初步的分析。在此基础上

提出了多断口真空断路器均压电容的研究建议

可为多断口真空断路器均压电容的深入研究提供参考。

Abstract

The voltage applied to each vacuum interrupter of a multi-break vacuum circuit breaker is not equal one another because of stray capacitances.But the selection standard of grading capacitors for multi-break vacuum circuit breakers has not yet been published now.In this paper

the present research on grading capacitors for multi-break vacuum circuit breakers was overviewed.The positive role and negative effect of grading capacitors for the improvement of breaking capability of multi-break vacuum circuit breakers were summarized

and the mechanism of the positive and negative effect was analyzed.The limitation of available research results was also pointed out

and a preliminary analysis was given.Based on the analysis

several suggestions are proposed

which can provide reference for the further study of grading capacitors.

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