SUN Li-cun, XIONG Ju, CHEN Zhao-qiang, et al. Analysis of a 220kV Line Trip Caused by High-resistance Earthing[J]. High voltageapparatus, 2011, 47(6): 58-61+66.
SUN Li-cun, XIONG Ju, CHEN Zhao-qiang, et al. Analysis of a 220kV Line Trip Caused by High-resistance Earthing[J]. High voltageapparatus, 2011, 47(6): 58-61+66. DOI: 10.13296/j.1001-1609.hva.2011.06.013.
Analysis of a 220kV Line Trip Caused by High-resistance Earthing
The protective action behaviors of a 220 kV transmission line at both sides are analyzed
on which a trip fault occurred due to high-resistance earthing.This breakdown is an unusual non-typical developing fault in the electrical power system inducing complex protective actions at both sides of the fault.It seems that the protective actions at both sides of the fault were inconsistent and were even misoperation
however
the protective actions are proved correct according to the principles of the WXH-803A and RCS-902BF devices and the further analysis of the oscillograph.