XING Peng1, CHENG Qiong1, LI Xia2, et al. High Power Test System for Novel High Power Electronic Device[J]. High VoltageApparatus, 2012, 48(7): 52-56. DOI: 10.13296/j.1001-1609.hva.2012.07.013.
High Power Test System for Novel High Power Electronic Device
The author introduces a test system of novel high power electronic device and explains the composition and test capacity of the system in detail in this paper.According to the novel power electronic device test system functional requirements
the test system is divided into 3 functional test areas of power compensation test area
frequency test area
rectifying test area.Every experimental zone can meet all kinds of novel high power electronic device factory test and type test.Engineering practice has proved that
the novel power electronic device test system hardware structure is of high reliability
convenient operation and higher measuring precision