Development of Verification Equipment of High Voltage Switch Mechanical Characteristic Testing Instrument

WANG Hao1; LEI Min2; ZHANG Jun2; SUN Yi3; SONG Wei4; XU Zi-Li2; QI Cong2; LIANG Bo1; LIN Fei-peng1

doi:10.13296/j.1001-1609.hva.2012.08.013

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Development of Verification Equipment of High Voltage Switch Mechanical Characteristic Testing Instrument

更新时间：2025-04-26

- Development of Verification Equipment of High Voltage Switch Mechanical Characteristic Testing Instrument
- High VoltageApparatus Vol. 48, Issue 8, Pages: 65-70(2012)
- 作者机构：
  
  1. 中国计量科学研究院电磁所
  2. 中国电力科学研究院
  3. 北京东方计量测试研究所
  4. 新疆维吾尔自治区计量测试研究院
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2012.08.013
  CLC： TM564
- Published：2012
- 稿件说明：
移动端阅览
[1]王昊,雷民,张军,孙毅,宋伟,徐子立,齐聪,梁波,林飞鹏.高压开关动作特性溯源计量标准装置的研制[J].高压电器,2012,48(08):65-70.

WANG Hao1, LEI Min2, ZHANG Jun2, et al. Development of Verification Equipment of High Voltage Switch Mechanical Characteristic Testing Instrument[J]. High voltageapparatus, 2012, 48(8): 65-70.
[1]王昊,雷民,张军,孙毅,宋伟,徐子立,齐聪,梁波,林飞鹏.高压开关动作特性溯源计量标准装置的研制[J].高压电器,2012,48(08):65-70. DOI： 10.13296/j.1001-1609.hva.2012.08.013.

WANG Hao1, LEI Min2, ZHANG Jun2, et al. Development of Verification Equipment of High Voltage Switch Mechanical Characteristic Testing Instrument[J]. High voltageapparatus, 2012, 48(8): 65-70. DOI： 10.13296/j.1001-1609.hva.2012.08.013.

摘要

笔者设计了一种新型的高压开关动作特性测试仪计量标准装置

能够对高压开关动作特性测试仪进行高效的检定、校准工作。该标准装置基于ARM9和FPGA嵌入式技术

使用COPLEY直线电机模组TBX-2504作为速度产生装置

采用高速功率管作为断口

能够产生高速可控的速度信号以及标准的时间信号。该标准装置的软件操作便捷

人机界面友好。经过国家法定计量机构的校准

该标准装置达到设计要求。

Abstract

In this paper

a measuring standard equipment of high voltage switch mechanical characteristic testing instrument is developed

which can use for calibration of high voltage switch mechanical characteristic testing instrument efficiently.The standard equipment based on ARM and FPGA technique

use COPLEY linear motor TBX-2504 as speed module

use high speed MOSFET as speed signal and time signal.According to the test data provided by National Legal Metrology Institutions

the device performance parameters meet the design requirements.

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