LIU Gang, RUAN Ban-yi. Experimental Analysis of the 10 kV XLPE Cable Terminals with Defects Based on OWTS[J]. High voltageapparatus, 2012, 48(9): 31-36+42.
LIU Gang, RUAN Ban-yi. Experimental Analysis of the 10 kV XLPE Cable Terminals with Defects Based on OWTS[J]. High voltageapparatus, 2012, 48(9): 31-36+42. DOI: 10.13296/j.1001-1609.hva.2012.09.008.
Experimental Analysis of the 10 kV XLPE Cable Terminals with Defects Based on OWTS
Distortion of local electric field is easy to be induced by the defects of semi-conductive layer at 10 kV XLPE cable terminals
leading to breakdown fault in the process of cable terminal/connector installation.In this paper
a circuit model of the cable terminal is constructed after stripping the shielding layer and semi-conductive layer.The analysis of the model illustrates that the electric field of the interface between XLPE and semi-conductive layer is related with the inductivity of surrounding media and the inclination angle α.The horizontal and vertical electric fields of three parameter sets are simulated by the finite element simulation software.The results show that the electric field is perfect when the angle α is about 6°.The cable terminals without chamfered semi-conductive layer are tested by OWTS on the basis of analysis of the experimental principle
and the results demonstrate that OWTS can detect defect type of semi-conductive layer effectively.