YAN Wen-bin~. Application of X-ray Technology in Composite Insulators Defect Diagnosis[J]. High voltageapparatus, 2012, 48(10): 58-66. DOI: 10.13296/j.1001-1609.hva.2012.10.013.
Application of X-ray Technology in Composite Insulators Defect Diagnosis
composite insulators are widely used in our country about ten million.But for its particularity
the traditional insulator detection methods cannot be completely used in the composite insulator’s detection
so it needs a new type composite insulator testing technology to promote the development of composite insulators.In this paper
we test the through ability of X-ray for composite insulator
and we get some parameters for the X-ray detection technology for composite insulator.Then we use the nondestructive testing technology of X-ray to detect lots of simulation defects in four areas of composite insulators(the umbrella skirt and sheath area
the mandrel area
the connection interface between the sheath and the mandrel
the metal parts area)
to detect some used composite insulators
with those parameters.From the many X-ray imaging drawing we get
it can be clearly see that the internal structure of composite insulators
that the defects type and their position
and it can be measured the sheath thickness and the mandrel diameter.The result can be used as a practical reference for the X-ray detection technology for composite insulators’ defect detection and type detection.