On-load Tap-changer Field Testing Waveform Analysis of 500 kV Electric Power Autotransformer

WU Dong-wen; WANG Ling; HE Jing

doi:10.13296/j.1001-1609.hva.2012.12.025

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On-load Tap-changer Field Testing Waveform Analysis of 500 kV Electric Power Autotransformer

更新时间：2025-04-26

- On-load Tap-changer Field Testing Waveform Analysis of 500 kV Electric Power Autotransformer
- High VoltageApparatus Vol. 48, Issue 12, Pages: 121-125(2012)
- 作者机构：
  
  江西省电力公司超高压分公司
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2012.12.025
  CLC： TM403.4
- Published：2012
- 稿件说明：
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[1]吴冬文,王令,何晶.500kV自耦变压器有载分接开关现场测量波形分析[J].高压电器,2012,48(12):121-125.

WU Dong-wen, WANG Ling, HE Jing. On-load Tap-changer Field Testing Waveform Analysis of 500 kV Electric Power Autotransformer[J]. High voltageapparatus, 2012, 48(12): 121-125.
[1]吴冬文,王令,何晶.500kV自耦变压器有载分接开关现场测量波形分析[J].高压电器,2012,48(12):121-125. DOI： 10.13296/j.1001-1609.hva.2012.12.025.

WU Dong-wen, WANG Ling, HE Jing. On-load Tap-changer Field Testing Waveform Analysis of 500 kV Electric Power Autotransformer[J]. High voltageapparatus, 2012, 48(12): 121-125. DOI： 10.13296/j.1001-1609.hva.2012.12.025.

摘要

采用4过渡电阻的M型有载分接开关广泛应用于500 kV自耦变压器

测量分接开关工作过程中的切换波形、过渡时间及过渡电阻是变压器必做的例行试验项目

用于检查切换开关特性。介绍了M型有载分接开关切换过渡过程及500 kV自耦变压器4过渡电阻有载分接开关直流测试波形结构特点

开关机械系统的弹跳影响波形整齐性、变压器的大容量影响其测量接线方式

测量仪器内部电阻与过渡电阻的匹配影响波形的分辨

现场测试时需仔细分辨并加以评估。

Abstract

The M-model on-load tap-changer including 4 transient resistance has been used widely in 500 kV electric power autotransformer

the test of switching figure

transition duration and fault resistance in process of the on-load tap-changer is must been done in environmental test items of the transformer

which use to examine bridging switch function.This paper introduces the process of the M-model on-load tap-changer and characteristics of the DC circuits testing waveform of the on-load tap-changer including 4 transient resistance in 500 kV electric power autotransformer

the mechanical systems bouncing affects accuracy of the test waveform

the high-transformer affects uniformity of the test waveform

the matching factor of the instrument inner resistance with the transient resistance affects discernibility of the test waveform

need discern carefully and moreover assess for the test locale.

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