RAN Xue-bin, LU Ci, CHENG Li, et al. Fracture Fault Analysis and Aging Mechanism Study for 500 kV Composite Insulator[J]. High voltageapparatus, 2013, 49(9): 35-43.
RAN Xue-bin, LU Ci, CHENG Li, et al. Fracture Fault Analysis and Aging Mechanism Study for 500 kV Composite Insulator[J]. High voltageapparatus, 2013, 49(9): 35-43. DOI: 10.13296/j.1001-1609.hva.2013.09.028.
Fracture Fault Analysis and Aging Mechanism Study for 500 kV Composite Insulator
whose fracture characteristics differ from those of brittle fracture
is analyzed in order to identify the aging mechanisms involved and their causes.Several sheath punctures occurred along the insulator which apparently originated from inside the insulator.Removal of the sheath revealed weak adhesion as well as tracking along the sheath-core interface.Weak microscopic as well as macroscopic interfaces were observed.The core material was analyzed by means of FTIR identifying glass corrosion
ion exchange and hydrolysis as major degradation mechanisms.Based on the results of analysis a water induced aging process is proposed and recommendations for online monitoring of composite insulators with respect to interfacial aging are given.