Research for Voltage and Frequency of Intelligent Series Resonant Test Power Supply

HUANG Xinbo; ZHANG Zhouxiong; CHENG Wenfei; SHI Jie; XIANG Qian

doi:10.13296/j.1001-1609.hva.2014.06.002

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Research for Voltage and Frequency of Intelligent Series Resonant Test Power Supply

更新时间：2025-04-26

- Research for Voltage and Frequency of Intelligent Series Resonant Test Power Supply
- High VoltageApparatus Vol. 50, Issue 6, Pages: 7-12(2014)
- 作者机构：
  
  西安工程大学电子信息学院
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2014.06.002
  CLC： TM83
- Published：2014
- 稿件说明：
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[1]黄新波,张周熊,程文飞,石杰,向乾.智能型串联谐振试验电源电压及频率的研究[J].高压电器,2014,50(06):7-12.

HUANG Xinbo, ZHANG Zhouxiong, CHENG Wenfei, et al. Research for Voltage and Frequency of Intelligent Series Resonant Test Power Supply[J]. High voltageapparatus, 2014, 50(6): 7-12.
[1]黄新波,张周熊,程文飞,石杰,向乾.智能型串联谐振试验电源电压及频率的研究[J].高压电器,2014,50(06):7-12. DOI： 10.13296/j.1001-1609.hva.2014.06.002.

HUANG Xinbo, ZHANG Zhouxiong, CHENG Wenfei, et al. Research for Voltage and Frequency of Intelligent Series Resonant Test Power Supply[J]. High voltageapparatus, 2014, 50(6): 7-12. DOI： 10.13296/j.1001-1609.hva.2014.06.002.

摘要

智能型串联谐振试验电源采用变频变压的方法来使试验回路谐振实现二次升压

是电气设备进行耐压试验不可缺少的检测设备。文中介绍了一种智能型串联谐振试验电源系统的电压及频率控制策略

采用内环电流值外环电压平均值双闭环PI调节器实现电压的跟踪

采用离散傅里叶变换（DFT）求取相位差的方法实现了对系统谐振频率的自动跟踪。实验数据表明

该试验装置具有电源设备容量小、交流等效性好等特点

是目前对高电压等级被测试品进行耐压试验行之有效的方法。

Abstract

Intelligent series resonant test power source adopts the method of frequency conversion variable pressure to make resonant test circuits to realize the secondary booster

which is indispensable to withstand voltage test electrical equipment testing equipment. This paper introduces a kind of intelligent series resonant test power system voltage and frequency control strategy

outer ring with inner ring current value average voltage double closed loop PI regulator realize voltage tracking

using the discrete Fourier transform（DFT） to calculate the phase difference method to realize the system resonant frequency automatic tracking. The experimental data show that the test device has a small power equipment capacity and has good AC equivalence

which is an effective method currently for the high voltage level grade products to withstand voltage test.

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