ZHONG Lei, SHEN Meng, LI Hualiang, et al. Test Circuit Development for Limit the Lightning Impulse Overshoot for UHV Switchgear[J]. High voltageapparatus, 2014, 50(10): 20-24+30.
ZHONG Lei, SHEN Meng, LI Hualiang, et al. Test Circuit Development for Limit the Lightning Impulse Overshoot for UHV Switchgear[J]. High voltageapparatus, 2014, 50(10): 20-24+30. DOI: 10.13296/j.1001-1609.hva.2014.10.028.
Test Circuit Development for Limit the Lightning Impulse Overshoot for UHV Switchgear
the high overshoot problem in the lightning impulse test has become a hot spot technical problem at home and abroad with the popularity of UHV switchgear. The overshoot still can not be restricted within 10% through the experience of the lightning impulse voltage test of UHV switchgear
which is specified as the limits in the latest standards IEC 60060-1:2010 and GB/T 16927—2011. In this paper
the damping device
which is designed and developed by modeling and simulation
can inhibit overshoot effectively by being applied to the lightning impulse test circuit. The overshoot reduced from 22%to about 5% according with the requirement
and the research result are helpful for practical experiment.