Evaluating Internal Pressure of Vacuum Interrupters with X-ray Measurement Method

GUO Liping; WANG Dezhong

doi:10.13296/j.1001-1609.hva.2015.01.016

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Evaluating Internal Pressure of Vacuum Interrupters with X-ray Measurement Method

更新时间：2025-04-26

- Evaluating Internal Pressure of Vacuum Interrupters with X-ray Measurement Method
- High VoltageApparatus Vol. 51, Issue 1, Pages: 92-97(2015)
- 作者机构：
  
  上海电气输配电试验中心有限公司
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2015.01.016
  CLC： TM561.5
- Published：2015
- 稿件说明：
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[1]郭丽萍,王德忠.X射线法评估灭弧室真空度的可能性研究[J].高压电器,2015,51(01):92-97.

GUO Liping, WANG Dezhong. Evaluating Internal Pressure of Vacuum Interrupters with X-ray Measurement Method[J]. High voltageapparatus, 2015, 51(1): 92-97.
[1]郭丽萍,王德忠.X射线法评估灭弧室真空度的可能性研究[J].高压电器,2015,51(01):92-97. DOI： 10.13296/j.1001-1609.hva.2015.01.016.

GUO Liping, WANG Dezhong. Evaluating Internal Pressure of Vacuum Interrupters with X-ray Measurement Method[J]. High voltageapparatus, 2015, 51(1): 92-97. DOI： 10.13296/j.1001-1609.hva.2015.01.016.

摘要

笔者主要针对目前中压开关设备中使用非常广泛的真空灭弧室

研究其X射线吸收剂量率与真空度的关系

探讨以X射线吸收剂量率作为参量评估真空灭弧室的真空度的可能性。实验结果表明

经过电压老炼的真空灭弧室

在真空度低于10-2Pa时

也可能通过工频耐压试验

但其X射线发射的起始平均电场强度显著降低。因此X射线测量可与工频耐压试验配合进行

以检测出可通过耐压、但真空度已低于10-2Pa的灭弧室。

Abstract

This paper focuses on vacuum interrupters which are widely applied in medium-voltage switchgears.The relationship between X-ray absorption ratio and internal pressure of a vacuum interrupter is analyzed in order to obtain a new method for evaluating the internal pressure by X-ray absorption ratio.Experimental result indicates that even though the internal pressure is lower than 10-2Pa

the vacuum interrupter is possible to pass the power frequency voltage test

however the initial average electric field intensity of X-ray radiation gets lower significantly.Therefore

combining with power frequency voltage test

X-ray measurement method can be used to find out those vacuum interrupters that have passed power frequency voltage test but the internal pressure is lower than 10-2Pa.

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Related Author

LI Wei1

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Related Institution

China Electric Power Research Institute

Shanxi Baoguang Vacuum Electronic Device Co.Ltd.

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Province-Ministry Joint Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability,Hebei University of Technology

Tianjin East City Power Supply Subsidiary

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