Study on Lifetime Characteristics of Metallized Film Capacitors Based on Selfhealing Property

YU Chenglong; DU Tao; LI Hua; LI Zhiwei

doi:10.13296/j.1001-1609.hva.2015.04.023

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Study on Lifetime Characteristics of Metallized Film Capacitors Based on Selfhealing Property

更新时间：2025-04-26

- Study on Lifetime Characteristics of Metallized Film Capacitors Based on Selfhealing Property
- High VoltageApparatus Vol. 51, Issue 4, Pages: 124-128(2015)
- 作者机构：
  
  1. 中国工程物理研究院电子工程研究所
  2. 华中科技大学强电磁工程与新技术国家重点实验室
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2015.04.023
  CLC： TM53
- Published：2015
- 稿件说明：
移动端阅览
[1]于成龙,杜涛,李化,李智威.基于金属化膜自愈特性的电容器寿命研究[J].高压电器,2015,51(04):124-128.

YU Chenglong, DU Tao, LI Hua, et al. Study on Lifetime Characteristics of Metallized Film Capacitors Based on Selfhealing Property[J]. High voltageapparatus, 2015, 51(4): 124-128.
[1]于成龙,杜涛,李化,李智威.基于金属化膜自愈特性的电容器寿命研究[J].高压电器,2015,51(04):124-128. DOI： 10.13296/j.1001-1609.hva.2015.04.023.

YU Chenglong, DU Tao, LI Hua, et al. Study on Lifetime Characteristics of Metallized Film Capacitors Based on Selfhealing Property[J]. High voltageapparatus, 2015, 51(4): 124-128. DOI： 10.13296/j.1001-1609.hva.2015.04.023.

摘要

金属化膜电容器具有高储能密度、高可靠性和高寿命特点。自愈是导致电容器电容量下降的主要原因。笔者分析金属化膜的自愈特性和电容量下降机制

通过研究自愈过程中的自愈面积、自愈能量和击穿电压的关联性

得出电压幅值和电压反峰比对电容器的寿命影响程度并归纳出经验公式。通过对金属化膜电容器的寿命测试

对经验公式中的系数进行拟合。最后得出不同电压幅值和不同电压反峰比下电容器寿命经验型预测公式。

Abstract

Metallized polypropylene film capacitors possess characteristics of high energy densities

high reliabilities and long lifetime. The selfhealing is one of main factors resulting in the capacitance decline.This paper analyzes the selfhealing property of the metallized film and the mechanism of capacitance decline. The effect of voltage amplitude and reversals on lifetime performance are deduced based on analyzing of the correlations between the clearing area

selfhealing energy and breakdown voltage.Experiments are designed to acquire the lifetime under different voltage amplitude and reversals and key parameters are fitted based on the experimental lifetime. Furthermore

empirically deduced prediction formula for the lifetime under different voltage amplitude and reversals is concluded.

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