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Statistical Analysis of Basic Defects in Conventional DC Main Equipment Based on Defect Records
更新时间:2025-04-26
    • Statistical Analysis of Basic Defects in Conventional DC Main Equipment Based on Defect Records

    • High VoltageApparatus   Vol. 51, Issue 8, Pages: 180-185(2015)
    • DOI:10.13296/j.1001-1609.hva.2015.08.030    

      CLC: TM506
    • Published:2015

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  • CHEN Yue, CHEN Xiangyu, DENG Jun, et al. Statistical Analysis of Basic Defects in Conventional DC Main Equipment Based on Defect Records[J]. High voltageapparatus, 2015, 51(8): 180-185. DOI: 10.13296/j.1001-1609.hva.2015.08.030.

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