DUAN Shaofeng, LI Zhibing, ZHAN Huamao, et al. Research on Very Fast Transient Test Circuit for 252 kV GIS[J]. High voltageapparatus, 2016, 52(2): 28-34+41.
DUAN Shaofeng, LI Zhibing, ZHAN Huamao, et al. Research on Very Fast Transient Test Circuit for 252 kV GIS[J]. High voltageapparatus, 2016, 52(2): 28-34+41. DOI: 10.13296/j.1001-1609.hva.2016.02.005.
Research on Very Fast Transient Test Circuit for 252 kV GIS