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Research on Very Fast Transient Test Circuit for 252 kV GIS
更新时间:2025-04-26
    • Research on Very Fast Transient Test Circuit for 252 kV GIS

    • High VoltageApparatus   Vol. 52, Issue 2, Pages: 28-34+41(2016)
    • DOI:10.13296/j.1001-1609.hva.2016.02.005    

      CLC: TM595
    • Published:2016

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  • DUAN Shaofeng, LI Zhibing, ZHAN Huamao, et al. Research on Very Fast Transient Test Circuit for 252 kV GIS[J]. High voltageapparatus, 2016, 52(2): 28-34+41. DOI: 10.13296/j.1001-1609.hva.2016.02.005.

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Related Author

RUAN Quan-rong
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Related Institution

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