Study on the Internal Temperature Distribution of UHVDC Voltage Measuring Device

FENG Jianhua; WANG Shan; ZHAO Linan; CHEN Bing; ZENG Lincui; MA Hongyi; LEI Peng

doi:10.13296/j.1001-1609.hva.2016.06.007

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Study on the Internal Temperature Distribution of UHVDC Voltage Measuring Device

更新时间：2025-04-26

- Study on the Internal Temperature Distribution of UHVDC Voltage Measuring Device
- High VoltageApparatus Vol. 52, Issue 6, Pages: 41-45(2016)
- 作者机构：
  
  1. 西安高压电器研究院有限责任公司
  2. 西安西电高压开关有限责任公司
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2016.06.007
  CLC： TM721.1
- Published：2016
- 稿件说明：
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[1]冯建华,王珊,赵力楠,陈冰,曾林翠,马洪义,雷鹏.特高压直流电压测量装置内部温度分布研究[J].高压电器,2016,52(06):41-45.

FENG Jianhua, WANG Shan, ZHAO Linan, et al. Study on the Internal Temperature Distribution of UHVDC Voltage Measuring Device[J]. High voltageapparatus, 2016, 52(6): 41-45.
[1]冯建华,王珊,赵力楠,陈冰,曾林翠,马洪义,雷鹏.特高压直流电压测量装置内部温度分布研究[J].高压电器,2016,52(06):41-45. DOI： 10.13296/j.1001-1609.hva.2016.06.007.

FENG Jianhua, WANG Shan, ZHAO Linan, et al. Study on the Internal Temperature Distribution of UHVDC Voltage Measuring Device[J]. High voltageapparatus, 2016, 52(6): 41-45. DOI： 10.13296/j.1001-1609.hva.2016.06.007.

摘要

特高压直流电压测量装置测量精度与温度变化有较大的关系。要保证运行装置在温度范围内满足测量精度要求

开展装置内部温度分布研究是十分必要的。文中首先对装置进行了动态流场分析、建立了流场模型

通过分析模型计算得到不同环境温度下装置的内部温度分布

通过试验

直接测量装置额定电压运行时的内部温升

验证了模型的有效性。文中对研究方法给出了较为详细的阐述

通过研究装置的内部温度分布可知装置运行时的温度范围

在设计制造装置时可以更有针对性地选取适用的电阻器件

以满足装置测量精度的要求。

Abstract

The measuring accuracy of UHVDC voltage measuring device has a great relationship with the temperature. It is necessary to study the internal temperature distribution of the device to ensure that the operating device could meet the accuracy requirement in the temperature range. Firstly

the device dynamic thermal flow field is analyzed in this paper. The flow field model is established. Through analyzing the calculation model

the internal temperature distributions under different environment temperatures is obtained. And then

the internal temperature rise at the rated voltage is measured directly by experiment. And the validity of the model is verified by the experiment. This paper introduces the details of the method. By studying the internal temperature distribution of the device

the temperature range in which the device is running is gotten. Suitable resistive elements should be chosen during the design so as to meet the measuring accuracy of the device.

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