QI Geqing, WU Jianjun, DAI Siyuan, et al. Capacitance Rise Phenomenon of Power Cable in AC Voltage Withstand Test[J]. High voltageapparatus, 2016, 52(8): 155-160.
QI Geqing, WU Jianjun, DAI Siyuan, et al. Capacitance Rise Phenomenon of Power Cable in AC Voltage Withstand Test[J]. High voltageapparatus, 2016, 52(8): 155-160. DOI: 10.13296/j.1001-1609.hva.2016.08.026.
Capacitance Rise Phenomenon of Power Cable in AC Voltage Withstand Test
Capacitance rise phenomenon often appears in electric power system. However
less attention has been paid to this phenomenon in AC voltage withstand tests of high-voltage power cables
especially for long power cables. The capacitance rise phenomenon is usually ignored in the AC voltage withstand test for short power cable.While in the test for long cable
the situation becomes complex
where the capacitance rise even reaches several times of imposed voltage in the extreme condition
which is unacceptable in engineering. The paper analyzes the equivalent circuit of the cable’s distribution parameters
performs analog simulation to obtain the voltage responses at certain position under different frequencies and sheath grounding modes for ‘long’and ‘short’power cables