Experimental Study on Safety in 12 kV/1250 A Switchgear Applied Shape Memory Alloy Spacer

YIN Ligeng; CHEN Tianxiang; LIU Yongming; HUANG Zhezhi

doi:10.13296/j.1001-1609.hva.2016.10.003

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Experimental Study on Safety in 12 kV/1250 A Switchgear Applied Shape Memory Alloy Spacer

更新时间：2025-04-26

- Experimental Study on Safety in 12 kV/1250 A Switchgear Applied Shape Memory Alloy Spacer
- High VoltageApparatus Vol. 52, Issue 10, Pages: 13-18(2016)
- 作者机构：
  
  厦门理工学院高电压技术福建省重点实验室
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2016.10.003
  CLC： TM591
- Published：2016
- 稿件说明：
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[1]殷立庚,陈天翔,刘勇铭,黄哲志.采用记忆合金垫片的12kV/1250A开关柜安全试验研究[J].高压电器,2016,52(10):13-18.

YIN Ligeng, CHEN Tianxiang, LIU Yongming, et al. Experimental Study on Safety in 12 kV/1250 A Switchgear Applied Shape Memory Alloy Spacer[J]. High voltageapparatus, 2016, 52(10): 13-18.
[1]殷立庚,陈天翔,刘勇铭,黄哲志.采用记忆合金垫片的12kV/1250A开关柜安全试验研究[J].高压电器,2016,52(10):13-18. DOI： 10.13296/j.1001-1609.hva.2016.10.003.

YIN Ligeng, CHEN Tianxiang, LIU Yongming, et al. Experimental Study on Safety in 12 kV/1250 A Switchgear Applied Shape Memory Alloy Spacer[J]. High voltageapparatus, 2016, 52(10): 13-18. DOI： 10.13296/j.1001-1609.hva.2016.10.003.

摘要

开关柜过热直接影响设备的安全稳定运行

开关柜柜内铜排连接部位的接触电阻是引起过热的重要原因之一。为了降低接触电阻提高设备运行的安全性

文中在开关柜中采用了记忆合金垫片

通过测试记忆合金垫片回复力随温度变化的关系

对比研究了采用普通垫片和记忆合金垫片的连接部位温度升高对接触电阻的影响

试验研究了额定电流下采用两种垫片时开关柜内部的温升。研究发现记忆合金垫片在预应变约束下回复力随温度升高显著增大

在连接部位松动条件下

采用记忆合金垫片比普通垫片的接触电阻明显降低

温升下降3

°C。记忆合金垫片的应用有助于提高开关柜运行的安全性。

Abstract

Overheating may affect the security and stability of operation in switchgears. Contact resistance of copper connection is one of the most important causes of overheating. In order to reduce contact resistance and to improve the safety of equipment operation

the switchgears mentioned in paper use shape memory alloy spacer. Through the experiment of shape memory alloy spacer

the relationship between recovery stress and temperature is analyzed. The effect of temperature rise on the contact resistance is studied in connection used common spacer and shape memory alloy spacer

and the inner temperature rise of switchgears used both spacers at rated current is also studied. The results show that

the recovery stres

s of memory alloy spacer increases significantly with the rise of temperature in the condition of tightening loose

the contact resistance of connection applied shape memory alloy spacer decreases significantly compared to the commons

and there is also 3

°C temperature drop of the temperature rise

which will help the improvement of stability of switchgears.

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