Impact of Process Parameter Variation on Temperature Rise of Dry-type Air-core Shunt Reactor

WANG Yan; TAN Xiangyu; SHU Hongchun; CHEN Jing; GUO Xiaobing; WU Yanlin; ZHANG Xuan; WANG Yonghong

doi:10.13296/j.1001-1609.hva.2016.10.031

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Impact of Process Parameter Variation on Temperature Rise of Dry-type Air-core Shunt Reactor

更新时间：2025-04-26

- Impact of Process Parameter Variation on Temperature Rise of Dry-type Air-core Shunt Reactor
- High VoltageApparatus Vol. 52, Issue 10, Pages: 182-186(2016)
- 作者机构：
  
  1. 云南电网公司研究生工作站
  2. 昆明理工大学
  3. 哈尔滨理工大学电气与电子工程学院
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2016.10.031
  CLC： TM47
- Published：2016
- 稿件说明：
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[1]王岩,谭向宇,束洪春,陈晶,郭小兵,吴彦霖,张轩,王永红.工艺偏差对干式空心电抗器局部温升的影响分析研究[J].高压电器,2016,52(10):182-186.

WANG Yan, TAN Xiangyu, SHU Hongchun, et al. Impact of Process Parameter Variation on Temperature Rise of Dry-type Air-core Shunt Reactor[J]. High voltageapparatus, 2016, 52(10): 182-186.
[1]王岩,谭向宇,束洪春,陈晶,郭小兵,吴彦霖,张轩,王永红.工艺偏差对干式空心电抗器局部温升的影响分析研究[J].高压电器,2016,52(10):182-186. DOI： 10.13296/j.1001-1609.hva.2016.10.031.

WANG Yan, TAN Xiangyu, SHU Hongchun, et al. Impact of Process Parameter Variation on Temperature Rise of Dry-type Air-core Shunt Reactor[J]. High voltageapparatus, 2016, 52(10): 182-186. DOI： 10.13296/j.1001-1609.hva.2016.10.031.

摘要

由于干式空心并联电抗器支路数非常多

工艺偏差会造成干式空心电抗器局部温升差异。局部温升过高会导致干式空心并联电抗器局部绝缘过早老化

降低干式空心电抗器的运行年限。因此文中针对BKDK-20000/35型干式并联空心电抗器进行模型建立

通过有限元数值计算分析

得到了不同整体半径、包封间距和匝数偏差情况下温升的变化进行研究

结果表明对于不同的工艺偏差类型

整体半径偏差引起各包封温升产生较小的变化

包封间距偏差引起各包封温升产生较大变化

匝数偏差引起各包封温升产生明显变化。为进一步控制干式空心并联电抗器生产过程工艺偏差量提供依据。

Abstract

Process parameter deviation may result in variation of local temperature rise of a dry-type air-core shunt reactor because the reactor contains many branches. Excessive local temperature rise will lead to early aging of local insulation of the reactor

reducing its service life. In this article

a model of BKDK-20000/35 dry-type aircore shunt reactor is established via finite element analysis

and the variations of temperature rise are obtained under different deviations of whole radius

encapsulation pitch

and number of turns.The results show that the overall radius deviation causes small change in temperature rise of encapsulation

the encapsulation pitch deviation causes significant change in temperature rise of encapsulation

and the number of turns deviation causes great change in temperature rise of encapsulation. This study may provide a reference for control of process parameter deviation in manufacturing dry-type air-core shunt reactors.

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