LI Dian, JIN Bairong, CHEN Xiaoyu, et al. Analysis of the Influence of Overvoltage Caused by the Restrike of Switching Capacitor Bank and NSDD on Capacitor[J]. High voltageapparatus, 2017, 53(3): 154-159.
LI Dian, JIN Bairong, CHEN Xiaoyu, et al. Analysis of the Influence of Overvoltage Caused by the Restrike of Switching Capacitor Bank and NSDD on Capacitor[J]. High voltageapparatus, 2017, 53(3): 154-159. DOI: 10.13296/j.1001-1609.hva.2017.03.024.
Analysis of the Influence of Overvoltage Caused by the Restrike of Switching Capacitor Bank and NSDD on Capacitor