To reduce the reignition rate of a vacuum interrupter in switching back to back capacitor bank

the effects of voltage ageing

current ageing and nanosecond pulse ageing on the 40.5 kV vacuum interrupter for switching back-to-back capacitor bank are investigated

hence effect of ageing method on 40.5 kV vacuum interrupter for switching back-to-back capacitor bank is obtained. The contact surface can be aged completely by the nanosecond pulse ageing method

while the contact surface can only be partly aged by the voltage or current ageing method. The vacuum interrupter aged by the nanosecond pulse ageing method can successfully pass the switching test of back-to-back capacitor bank. The vacuum interrupter aged by the current ageing method can pass the switching test of back-to-back capacitor bank for 16 times

then reignition occurs. The vacuum interrupter aged by the voltage ageing method can pass the same test for only once

then reignition occurs 300 ms after the switching.