Researches on a Probabilistic Indicating Method for Assessing End-of-life of Solid Insulating Materials Under Electrical Stress at Long-time Normal Working Conditions

YUAN Duanlei; WANG Haiyan; YANG Fang; ZHU Zhihao; FEI Xiang; CHENG Xian

doi:10.13296/j.1001-1609.hva.2017.04.006

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Researches on a Probabilistic Indicating Method for Assessing End-of-life of Solid Insulating Materials Under Electrical Stress at Long-time Normal Working Conditions

更新时间：2025-04-26

- Researches on a Probabilistic Indicating Method for Assessing End-of-life of Solid Insulating Materials Under Electrical Stress at Long-time Normal Working Conditions
- High VoltageApparatus Vol. 53, Issue 4, Pages: 31-35+40(2017)
- 作者机构：
  
  1. 平高集团有限公司
  2. 郑州大学电气工程学院
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2017.04.006
  CLC： TM21;TM591
- Published：2017
- 稿件说明：
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[1]袁端磊,王海燕,杨芳,朱志豪,费翔,程显.固体绝缘件长时间正常工作条件下电老化寿命评估方法研究[J].高压电器,2017,53(04):31-35+40.

YUAN Duanlei, WANG Haiyan, YANG Fang, et al. Researches on a Probabilistic Indicating Method for Assessing End-of-life of Solid Insulating Materials Under Electrical Stress at Long-time Normal Working Conditions[J]. High voltageapparatus, 2017, 53(4): 31-35+40.
[1]袁端磊,王海燕,杨芳,朱志豪,费翔,程显.固体绝缘件长时间正常工作条件下电老化寿命评估方法研究[J].高压电器,2017,53(04):31-35+40. DOI： 10.13296/j.1001-1609.hva.2017.04.006.

YUAN Duanlei, WANG Haiyan, YANG Fang, et al. Researches on a Probabilistic Indicating Method for Assessing End-of-life of Solid Insulating Materials Under Electrical Stress at Long-time Normal Working Conditions[J]. High voltageapparatus, 2017, 53(4): 31-35+40. DOI： 10.13296/j.1001-1609.hva.2017.04.006.

摘要

随着电力系统对小型化开关设备需求的日益增加

固体绝缘开关柜逐渐成为配电领域的研究热点。为了研究12 k V开关柜中10 mm厚度固体绝缘材料的老化过程并预测其绝缘寿命

文中采用具有不等直径的电极对环氧树脂板样品进行了电老化试验

并对老化过程中环氧树脂板的相关绝缘参数进行了测量。通过设定一个电老化寿命终点

采用威布尔分布法处理试验数据得到不同电压等级下试样的特征寿命

使用MATLAB拟合出该试验条件下的逆幂律公式

外推得到10 mm×10 mm×2 mm环氧树脂板在折算的2.4 k V工频电压下的绝缘寿命

为固体开关用绝缘材料的电老化寿命评估提出一种可供借鉴的方法

同时提出了提高老化试验效率和设备维护的建议。

Abstract

Researches on the solid insulated switchgear is becoming a hot topic in area of distribution network

due to the increasing demand for the miniaturization of switchear in power system. In order to describe the aging process of solid insulating material in switchgear and predict its insulation life

samples of epoxy resin board were studied with unaqual-diameter electrodes in this paper. The related insulation parameters were measured in the aging process. By setting the end of electrical aging life

characteristic life under different voltage were given by applying Weibull distribution on the experimental data. The corresponding inverse power law formula was obtained using curve fitting in MATLAB. The life of 10 mm×2 mm epoxy resin board in 2.4 k V was obtained by extrapolating the data. A reference method for assessing the electrical aging life of insulating material in switchgear was put forward.In addition

the suggestions on improving the efficiency of the aging test and equipment maintenance were given.

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Related Institution

上海交通大学电气工程系上海200030

Department of Electrical Engineering,Shanghai Jiaotong University

State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University

甘肃电力科学研究院兰州理工大学电气工程与信息工程学院

College of Electrical Engineering and Information Engineering,Lanzhou University of Technology

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