TANG Bo, LIU Ren, LU Shaojun, et al. Fast Algorithm for the Temperature of Insulated Gate Bipolar Transistor Module[J]. High voltageapparatus, 2017, 53(4): 129-136.
TANG Bo, LIU Ren, LU Shaojun, et al. Fast Algorithm for the Temperature of Insulated Gate Bipolar Transistor Module[J]. High voltageapparatus, 2017, 53(4): 129-136. DOI: 10.13296/j.1001-1609.hva.2017.04.021.
Fast Algorithm for the Temperature of Insulated Gate Bipolar Transistor Module
In the efficient thermal design of insulated gate bipolar transistor(IGBT)module
long-term reliability assessment of converter system
and several other aspects
IGBT module temperature usually need to be got. However
the existing models and methods are time-consuming and difficult to solve the IGBT module temperature quickly. Based on the idea of direct method
this paper presents a new algorithm for solving the temperature of IGBT module. The power loss model of IGBT module is built with the fitting and interpolation algorithm; the equivalent lumped parameters Cauer thermal network of IGBT module is studied and established based on the electric heating analogy theory
and the thermal differential equation is differenced; Finally
a fast algorithm for solving the temperature of IGBT module is constructed in the same circuit simulator. In two-level three-phase inverter example
with comparing to the IPOSIM simulation results
the maximum error of the proposed algorithm is 3.01%
and the trend of temperature change is basically consistent with that of IPOSIM simulation; with comparing to the simulation time base on traditional physics-based IGBT device model
thermal network component model
the algorithm proposed improves the computation speed by nearly 1 255 times.
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Related Author
WANG Ru-wen
SHEN Tan
LIN Jing
LI Yan-ming
SI Wen-rong
GUO Zhi-feng
WU Peng
GUO Hong
Related Institution
School of Electrical Engineering,Xi’an Jiaotong University
西安交通大学电气工程学院 陕西西安710049
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