WU Wengeng, FANG Chun’en, CHEN Junping, et al. Design and Experimental Study on Electromagnetic Repulsion Mechanism of Ultra-fast Disconnect Switch[J]. High voltageapparatus, 2017, 53(4): 156-163.
WU Wengeng, FANG Chun’en, CHEN Junping, et al. Design and Experimental Study on Electromagnetic Repulsion Mechanism of Ultra-fast Disconnect Switch[J]. High voltageapparatus, 2017, 53(4): 156-163. DOI: 10.13296/j.1001-1609.hva.2017.04.025.
Design and Experimental Study on Electromagnetic Repulsion Mechanism of Ultra-fast Disconnect Switch
total fault clearing time is mainly dependent on the reaction time of the ultra-fast disconnect switch(UFDS). Based on the principle of electromagnetic repulsion mechanism(ERM)of UFDS
the finite element model of electromagnetic repulsion mechanism is established in this paper. In addition
by means of systematic and comprehensive simulations
the influence of the parameters of the coil and the size of the metal plate on the dynamic characteristics of UFDS is simulated and analyzed
and based on this the parameters of ERM are optimized. Finally
a prototype of UFDS based on ERM is built. A series dynamic characteristic test results show that the designed ERM can meet the requirements of transient interrupt voltage(TIV)insulation distance during the fault cleaning process UFDS 2 ms. According to the experiment results
the simulation results are in good agreement with the experimental observations
which guarantee for the realization of hybrid HVDC CB.