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Study on the Conducted Coupling Effect Way Through the Electronic Transformer Under Transient Electromagnetic Interference
更新时间:2025-04-26
    • Study on the Conducted Coupling Effect Way Through the Electronic Transformer Under Transient Electromagnetic Interference

    • High VoltageApparatus   Vol. 53, Issue 4, Pages: 164-170(2017)
    • DOI:10.13296/j.1001-1609.hva.2017.04.026    

      CLC: TM45
    • Published:2017

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  • XIN Weifeng, WANG Dong, KOU Xiaoshi, et al. Study on the Conducted Coupling Effect Way Through the Electronic Transformer Under Transient Electromagnetic Interference[J]. High voltageapparatus, 2017, 53(4): 164-170. DOI: 10.13296/j.1001-1609.hva.2017.04.026.

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