Simulation of Temperature Field in the Switchgear with Memory Alloy Pressing Reed on Tulip Contact

HUANG Mengzhe; CHEN Li’an

doi:10.13296/j.1001-1609.hva.2017.06.015

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Simulation of Temperature Field in the Switchgear with Memory Alloy Pressing Reed on Tulip Contact

更新时间：2025-04-26

- Simulation of Temperature Field in the Switchgear with Memory Alloy Pressing Reed on Tulip Contact
- High VoltageApparatus Vol. 53, Issue 6, Pages: 84-89(2017)
- 作者机构：
  
  厦门理工学院福建省高电压技术重点试验室
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2017.06.015
  CLC： TM591
- Published：2017
- 稿件说明：
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[1]黄勐哲,陈丽安.装有记忆合金压片梅花触头的开关柜温度场仿真分析[J].高压电器,2017,53(06):84-89.

HUANG Mengzhe, CHEN Li’an. Simulation of Temperature Field in the Switchgear with Memory Alloy Pressing Reed on Tulip Contact[J]. High voltageapparatus, 2017, 53(6): 84-89.
[1]黄勐哲,陈丽安.装有记忆合金压片梅花触头的开关柜温度场仿真分析[J].高压电器,2017,53(06):84-89. DOI： 10.13296/j.1001-1609.hva.2017.06.015.

HUANG Mengzhe, CHEN Li’an. Simulation of Temperature Field in the Switchgear with Memory Alloy Pressing Reed on Tulip Contact[J]. High voltageapparatus, 2017, 53(6): 84-89. DOI： 10.13296/j.1001-1609.hva.2017.06.015.

摘要

针对开关柜中真空断路器梅花触头处温升问题

基于记忆合金材料的温度形变功能

在梅花触头上安装记忆合金压片

提高梅花触头的工作性能。测量不同温度时梅花触头处的接触电阻

利用多物理场耦合分析软件COMSOL Multiphysics对开关柜的温度场进行仿真分析

并进行了试验验证。仿真结果与试验结果表明:断路器梅花触头处使用记忆合金压片其温升明显低于使用普通压片时的温升

说明记忆合金压片有助于降低梅花触头温升

提高开关柜运行的安全可靠性。

Abstract

To reduce temperature rise of tulip contacts in a vacuum circuit breaker and improve working performance of the contacts

memory alloy pressing reeds are set on them by making use of the alloy’s temperature-dependent deformation.The contact resistance of the tulip contacts is measured at different temperature

and the temperature field in the switchgear is simulated with the software COMSOL Multiphysics.Simulation and experiment show that the temperature rise of the contact with memory alloy reed is lower than that with common reed

indicating that the memory alloy pressing reed facilitate reduction of the tulip contact’s temperature rise and improvement of safety and reliability of the switchgear.

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