WU Yang, LAN Lei, YANG Fangnan, et al. Influence of the Test Current on Dynamic Resistance Measurements of SF6 Circuit Breakers[J]. High voltageapparatus, 2017, 53(9): 66-71+77.
WU Yang, LAN Lei, YANG Fangnan, et al. Influence of the Test Current on Dynamic Resistance Measurements of SF6 Circuit Breakers[J]. High voltageapparatus, 2017, 53(9): 66-71+77. DOI: 10.13296/j.1001-1609.hva.2017.09.011.
Influence of the Test Current on Dynamic Resistance Measurements of SF6 Circuit Breakers
circuitbreaker contacts can be obtained through the dynamic contact resistance measurement without dismantling circuit breakers.In order to study the influence of the test current on the dynamic resistance measurement of the SF
6
circuit breaker with different erosion degrees
simulated erosion experiment was carried on 126 kV SF
6
circuit breaker
and the dynamic resistance test under 3 kind of currents also is carried on the circuit breaker of 13 kind of erosion degrees. The result shows
that the higher the test current is
the smaller the resistance of arcing contactwhen the circuit breaker is of any degree
of erosion
but there is always no obvious link between the arcing contact travel and the test current. In addition
the dispersion of the test results decreases with the increase of the test current. However
when the erosion of the circuit breaker is very serious
the dispersion of results will be great regardless of the value of the test current.Therefore
considering the influence of test current on contact resistance
in order to obtain actualarcing contact resistance and to reduce the dispersion of test resultsconsidering the influence of test current on contact resistance
the larger dynamic resistance test current should be chosen as much as possible
and the dynamic resistance test must be carried on many times when contact erosion is extremely serious
so that the state of arcing contact can be obtained according to the distribution of test results.