Simulation Study on the Factors Influencing Oscillating Switching Impulse Test for Transformers

LIN Chunyao; ZHANG Zheming; LI Junhao; ZHOU Dan; YANG Xian; LIANG Wenjin

doi:10.13296/j.1001-1609.hva.2017.12.017

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Simulation Study on the Factors Influencing Oscillating Switching Impulse Test for Transformers

更新时间：2025-04-26

- Simulation Study on the Factors Influencing Oscillating Switching Impulse Test for Transformers
- High VoltageApparatus Vol. 53, Issue 12, Pages: 106-111+118(2017)
- 作者机构：
  
  1. 广东电网有限公司电力科学研究院
  2. 西安交通大学电气工程学院
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2017.12.017
  CLC： TM41
- Published：2017
- 稿件说明：
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[1]林春耀,张哲铭,李军浩,周丹,杨贤,梁文进.变压器振荡型操作冲击试验影响因素的仿真分析[J].高压电器,2017,53(12):106-111+118.

LIN Chunyao, ZHANG Zheming, LI Junhao, et al. Simulation Study on the Factors Influencing Oscillating Switching Impulse Test for Transformers[J]. High voltageapparatus, 2017, 53(12): 106-111+118.
[1]林春耀,张哲铭,李军浩,周丹,杨贤,梁文进.变压器振荡型操作冲击试验影响因素的仿真分析[J].高压电器,2017,53(12):106-111+118. DOI： 10.13296/j.1001-1609.hva.2017.12.017.

LIN Chunyao, ZHANG Zheming, LI Junhao, et al. Simulation Study on the Factors Influencing Oscillating Switching Impulse Test for Transformers[J]. High voltageapparatus, 2017, 53(12): 106-111+118. DOI： 10.13296/j.1001-1609.hva.2017.12.017.

摘要

采用感应式振荡型操作冲击电压对变压器进行现场冲击耐压试验具有效率高、易于调波、试验设备体积小等优点。为了研究影响变压器振荡型操作冲击试验的因素

建立了变压器振荡操作冲击耐压试验的仿真电路

并以一台110 kV变压器为例

针对发生器球隙导通电阻、变压器励磁电感饱对变压器高压侧波形的影响进行了仿真分析。研究结果表明冲击电压发生器球隙导通电阻会导致波形的波尾时间变短

而变压器励磁电感的饱和不会对振荡型冲击电压的波形产生影响

不会导致波形的畸变。文中的研究结果为现场开展变压器振荡型操作冲击耐压试验提供了理论指导。

Abstract

Oscillating switching impulse（OSI） test for transformers has the advantages in high efficiency

easy wave modulationng wave and smallerdecreasing the size of equipment.In order t To explore the factors that affect OSI test for transformers

in this studypaper

build a simulation model of OSI test for transformers

is built and takes a 110 kV transformer for example to investigate the effects ofused in study on how the on-resistor of ball gap switch and excitation inductance saturation affect on the test voltage on a 110 kV transformer waveform on high-voltage side.The results show that the on-resistor of ball gap switch will shorten tail time（Tt） of OSI waveform

and excitation inductance saturation won’t will not affect OSI waveform.These results may conclusion in this paper can offer a referencetheory advice tofor OSI test for transformers.

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