YUAN Yuan, FENG Jianqiang, JIANG Ning, et al. Research of Temperature-rise Test Method Based on the High-current[J]. High voltageapparatus, 2018, 54(1): 104-109.
YUAN Yuan, FENG Jianqiang, JIANG Ning, et al. Research of Temperature-rise Test Method Based on the High-current[J]. High voltageapparatus, 2018, 54(1): 104-109. DOI: 10.13296/j.1001-1609.hva.2018.01.015.
Research of Temperature-rise Test Method Based on the High-current
总结了在30 k A电流以上的大电流下实施单相温升试验过程中出现的问题及应对措施;通过多次的模拟研究
合理的构建相应的温升试验电流回路
同时考虑到该产品在此电流下的常规工况
简介了冷却装置的使用选型;为了在大电流下对产品性能进行准确的判定
针对试验过程中的数据测量系统进行了详细的校准与核查
并对试验得出的数据进行了处理分析
研究了数据采集过程中可能引起的误差来源
进行了不确定度的分析
以便更真实可靠地反映试验结果。通过研究并解决该试验过程中存在的诸多问题
给相关检测单位及生产厂家提供了一定的借鉴
对今后大电流温升试验的实施提供了有益的指导。
Abstract
Temperature-rise test is an important index of power equipment. This paper summarizes the problems inthe process of single-phase temperature-rise test under the high-current of more than 30 k A. Through several simula-tion studies
the corresponding temperature-rise test current loops are constructed
taking into account the productsin the current operating conditions
the combination of the cooling device is selected at the same time. In order to ac-curately determine the performance of the product at large current
the test data measurement system is calibratedand checked in detail. The test data and studied the possible sources of errors in the data acquisition process are ana-lyzed
then the uncertainty analysis is carried out. By studying the many problems in the course of the experiment
itprovides some reference and useful guidance for the relevant testing lab and the manufacturers.