Study on the Applicability of Detecting Deterioration Insulator Based on Infrared Thermal Image

FU Weiping; WANG Wei; DONG Junhu; LIU Yunpeng; ZHANG Kaiyuan

doi:10.13296/j.1001-1609.hva.2018.02.018

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Study on the Applicability of Detecting Deterioration Insulator Based on Infrared Thermal Image

更新时间：2025-04-26

- Study on the Applicability of Detecting Deterioration Insulator Based on Infrared Thermal Image
- High VoltageApparatus Vol. 54, Issue 2, Pages: 110-114+120(2018)
- 作者机构：
  
  1. 国网河北省电力有限公司检修分公司
  2. 华北电力大学电气工程系
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2018.02.018
  CLC： TM216
- Published：2018
- 稿件说明：
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[1]付炜平,王伟,董俊虎,刘云鹏,张凯元.利用红外热像技术检测劣化绝缘子的适用性分析研究[J].高压电器,2018,54(02):110-114+120.

FU Weiping, WANG Wei, DONG Junhu, et al. Study on the Applicability of Detecting Deterioration Insulator Based on Infrared Thermal Image[J]. High voltageapparatus, 2018, 54(2): 110-114+120.
[1]付炜平,王伟,董俊虎,刘云鹏,张凯元.利用红外热像技术检测劣化绝缘子的适用性分析研究[J].高压电器,2018,54(02):110-114+120. DOI： 10.13296/j.1001-1609.hva.2018.02.018.

FU Weiping, WANG Wei, DONG Junhu, et al. Study on the Applicability of Detecting Deterioration Insulator Based on Infrared Thermal Image[J]. High voltageapparatus, 2018, 54(2): 110-114+120. DOI： 10.13296/j.1001-1609.hva.2018.02.018.

摘要

文中针对某500 k V变电站发现的低零值绝缘子缺陷进行了红外热相技术检测劣化绝缘子的适用范围研究

分析了各个电压等级的盘形绝缘子串中电压分布规律

对劣化绝缘子在不同阻值、不同位置下的发热情况进行了计算

给出测试盲区的范围和改善方法。现场测试表明

该方法使红外热像技术在适用范围内检出劣化绝缘子的概率明显提高。

Abstract

This paper introduces a way of detecting zero and low resistance insulators defects in a 500 k V substationand studies the applicability of infrared thermal image technology used in deterioration insulator test area. The volt-age distribution of the insulator strings among various voltage levels are analyzed

the heat produced by the deteriora-tion insulators under different resistance and location are calculated

the boundary of blind zone of detection and anew field test method are proposed. Practical tests show that the new method make the success rate of detection basedon infrared thermal image technology improve remarkably in its applicable range.

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